X-ray diffraction characterization of ternary artificial superlattices
نویسنده
چکیده
Thin films of alternating Au, Ag, and Cu wedge-shaped metal layers were made by magnetron sputtering in order to develop a method for investigation of a multicomponent systems. X-ray-diffraction patterns of all as-deposited samples revealed satellites in the vicinity of ( 111) reflections, evidence of composition-modulated artificial superlattice formation. The experimental spectra are well explained by the kinematical diffraction theory for imperfect superlattices. Computer simulations have demonstrated extremely high sensitivity to the fluctuations AH/H of the superlattice period H. As a result, a rapid and simple method of AH/H determination is proposed.
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تاریخ انتشار 1999